Volume 1696: XRM 2014

Volume 1696: XRM 2014

Proceedings of the 12th International Conference on X‐Ray Microscopy

Edited by Martin D. de Jonge, David J. Paterson, and Christopher G. Ryan

Number of Volumes: 1
ISBN: 9780735413436

Volume 1696 is the proceedings of XRM 2014 (26–31 October 2014, Melbourne, Australia)

Title information

Summary of this volume: The International Conference on X-Ray Microscopy (XRM) showcased the world’s best practices in x-ray microscopy, the scope including novel measurements, new x-ray sources, industrial applications, correlative measurements, dedicated facilities, and data analysis. First begun in Göttingen in 1983, the series was triennial, but from 2008 it became biennial to match the growing pace of innovation. These proceedings are an adjunct to the more formal methods of scientific communication, enabling extended discussion of those very details and concepts that are so often incompatible with the goals of the literature.

These proceedings will be of interest to: Practitioners of x-ray microscopy. Some users of x-ray microscopy may be interested in particular applications as they appear. These proceedings will be of interest to those who design and develop x-ray facilities at synchrotron light sources, XFELs, and within the smaller laboratory. Personnel from other microscopy facilities (electron, proton, optical) may also be interested in some parts of the proceedings. The discussion is accessible to undergraduates, but the material will most likely be of interest to those at the Ph.D. level and beyond.

For further information about this volume: Please view the table of contents available on AIP Publishing's Scitation platform: Volume 1696 table of contents.

Number of Volumes: 1
Pages: 276
Language: English
Publisher: AIP Publishing