Advanced Analytical Techniques for Characterization of 2D Materials
Advanced Analytical Techniques for Characterization of 2D Materials
By Chandra Sekhar Rout and Dattatray J. Late
Title information
This timely and comprehensive book focuses on various analytical techniques used for 2D materials. It explores different characterization techniques to understand the structural features and properties of as-synthesized 2D materials and explores optical microscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS).
Advanced Analytical Techniques for Characterization of 2D Materials:
- Compiles a range of modern material characterizations of 2D materials for the first time.
- Includes a review of recent advances and provides a practical guide for traditional analytical techniques.
- Offers a pragmatic approach to the various analytical methods and recent advances
Research scholars and experienced researchers, scientists, technologists, and industrialists beginning their research into the exciting field of 2D nanotechnology will find this book a valuable resource and excellent guideline to explore novel materials and their properties.
